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Scientific User Facilities Division Office of Basic Energy Sciences |
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Dr. Altaf (Tof) H. Carim Scientific
User Facilities Division
U.S. Department of Energy |
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Education Experience Dr. Carim's primary expertise is in microstructural and microchemical characterization of materials, with research contributions in a variety of areas including semiconductor interfaces, superconducting and ferroelectric oxide thin films and ceramics, crystal structure determination, crystalline defects, joining of ceramics and composites, development of anisotropic microstructures, electron holography, and morphology of nanoparticles and nanowires. He has authored or coauthored over 85 research publications in these areas, including two book chapters, has edited two volumes, and has given more than 55 conference and seminar presentations. He has been active in numerous professional organizations, has organized a number of technical meetings and symposia, and has editorial roles with several journals. His awards and honors include recognition as an Office of Naval Research Young Investigator, receipt of an AIST Foreign Researcher Invitation to lecture in Japan, and an SEM Inc. Presidential Scholarship.
[X-ray/Neutron Scattering] [Nano Centers] [Electron Beam Microcharacterization Centers] [BES] [Office of Science] [DOE]
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