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Portable Parallel Beam X-Ray Diffraction System for In-Line Process Control in the Steel Industry--X-Ray Optical Systems, Inc., 30 Corporate Circle, Albany, NY 12203; 518-464-3334
Dr. Michael Haller, Principal Investigator
Mr. David Usher, Business Official
DOE Grant No. DE-FG02-99ER82918
Amount: $99,861

In-line process control is a vital method for improving and assuring product quality, maximizing process efficiency, and minimizing waste generation in many manufacturing industries, including the steel industry. X-ray diffraction, one of the most versatile analytical tools available, could provide valuable contributions. However, its use has essentially been confined to the laboratory environment because current techniques require prepared samples and the equipment is not suitable for use in a harsh manufacturing environment. This project will develop a parallel beam, x-ray diffractometer for in-line monitoring of phase, grain size, grain orientation, and residual stress. No sample preparation will be required, and the data quality will not be affected by sample vibration or roughness. Polycapillary x-ray optics will collect x-rays over a large solid angle from a low-power x-ray source and form an intense parallel beam. During Phase I, an existing compact, low-power, bread-board, x-ray diffraction unit will be modified to evaluate a specific microstructure condition, which is important in slab steel rolling and finishing. Actual steel samples will then be evaluated in the laboratory. The quality of the data and the ability of the system to operate reliably in the relevant manufacturing environment will also be evaluated.

Commercial Applications and Other Benefits as described by the awardee: Currently x-ray diffraction is used off-line to provide critical feedback to manufacturing. Continuous, in-line monitoring of material properties using x-ray diffraction should improve yield, decrease power requirements, and improve quality for a wide range of industries including steel, aluminum, cement, and pharmaceuticals.

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