18
A
Microwave Beam Monitoring System for Direct Measurement of Ultra Short Electron
Bunches--Haimson
Research Corporation, 3350 Scott Boulevard, Building 60, Santa Clara, CA
95054-3104; 408-988-6007
Dr.
Jacob Haimson, Principal Investigator, haimson@aol.com
Ms.
Beverly Mecklenburg, Business Official, haimson@aol.com
DOE
Grant No. DE-FG03-01ER83247
Amount:
$93,053
Recent
advances in high frequency linear accelerator technology have resulted in
steady-state electron beams having RF bunch widths of 50 to 200 femtoseconds,
considerably shorter than the practical resolution of fast diagnostic streak
camera systems. Therefore, the
accurate measurement of the longitudinal phase space of ultra short bunches
using microwave power would be highly advantageous and economically attractive,
especially if the complexity, sensitivity, and a priori assumptions
associated with alternative electro-optic methods could be avoided.
This project will develop a high gradient, circularly polarized, beam
deflecting microwave structure that provides a highly amplified image display
with the electron bunch phase and energy distributions projected in orthogonally
differentiated azimuthal and radial directions.
Combining such a higher-order mode structure with a beam focusing element
offers a simple on-line diagnostic for the definitive measurement of ultra short
RF bunches. In Phase I, a
detailed microwave and beam optics analysis of the proposed RF bunch diagnostic
system will be performed, and hardware design specifications will be
established.
Commercial
Applications And Other Benefits as
described by the awardee: The technology should result in an on-line beam
monitoring system capable of accurately evaluating the RF bunch performance of
advanced accelerator systems. The
attainment of very short RF bunches should be of considerable interest for free
electron lasers, wakefield accelerators, linear colliders, and the generation of
intense coherent radiation