Soft X-Ray Diagnostic Tool for Electron
Cyclotron Resonance Ion Sources--FARTECH, Inc., 3146 Bunche Avenue, San Diego, CA
92122-2247; 858-455-6655
Dr. Dana H. Edgell, Principal Investigator, edgell@far-tech.com
Dr. Jin-Soo Kim, Business Official, kimjs@far-tech.com
DOE Grant No. DE-FG03-01ER83244
Amount: $100,000
High
charge-state ions generated at the Electron Cyclotron Resonance Ion Source (ECRIS)
offer an opportunity to study unresolved nuclear physics issues.
However, there is currently a poor understanding of
the exact nature of the ion confinement time, the
electron-distribution-function (EDF), and the ion charge-state-distribution (CSD)
inside the plasma. This project will develop a non-invasive diagnostic tool for
the ECRIS to investigate ion confinement and to determine the plasma
charge-state-distribution (CSD) and electron-distribution-function (EDF) for a
broad variety of atomic species. In
Phase I, the soft x-ray spectrum of an ECRIS will be measured and analyzed to
determine EDF and internal CSD via modeling.
The core plasma density and CSD will be related to the extracted beam
current and CSD in order to determine the particle confinement for different ion
species. A suitable diagnostic
impurity emission line for high-resolution study will be identified.
Commercial
Applications And Other Benefits as described by awardee: This technology should find use in fusion research or industrial plasma
devices for the maintenance of high plasma efficiencies without disrupting
normal operations, and in the control or study of many plasmas such as in rare
ion sources.