60
Four
Probe Stage and Holder for Transmission Electron Microscope--Zyvex
Corporation, 1321 North Plano Road, Richardson, TX
75081-2473; 972-235-7881
Dr.
Min‑Feng Yu, Principal Investigator, mfyu@zyvex.com
Mr.
Timothy M. Gilmoir, Business Official, tgilmoir@zyvex.com
DOE
Grant No. DE-FG03-02ER83582
Amount:
$69,600
A direct, in-situ, high resolution
structural examination and analysis tool would benefit materials science
research. However, tool development,
especially nanomanipulation and in-situ characterization tools for a
transmission electron microscope (TEM), is currently lacking in many respects.
In particular, it is limited by having only one robotic arm. In
addition, most existing tools have problems in the accurate characterization of
the electrical properties of materials, due to excessive contact resistance.
This project will develop a four-probe stage and holder for TEM by
adopting a multiprobe approach for robotic manipulation and characterization. It
will offer the flexibility of four point probe electrical measurements on
materials either suspended in space or dispersed on surface.
Phase I will construct the new TEM holder, incorporating a four probe
manipulation and characterization platform with electrical feedthrough. Stick/slip
linear actuators, built within mini-sized piezotubes, will be assembled and
tested. The performance of the
proposed four probe stage and holder will be demonstrated inside a TEM.
Commercial
Applications and Other Benefits
as described by the awardee: The
device should become a powerful tool for researchers to accelerate their
investigations into the properties of nanomaterials and their applications. The
consequent expansion of research on nanomaterials and progress towards
applicable nanotechnology also should stimulate economic activity and usher in
new industries focused upon providing nanotechnology products.