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Al(In)GaN-Based High Electron Mobility Transistors on SiC for High Power Radar Applications--SVT Associates, 7620 Executive Drive, Eden Prairie, MN  55344-3677; 952-934-2100, www.svta.com 

Dr. Amir Dabiran, Principal Investigator, dabiran@svta.com 

Mr. Scott J. Vandal, Business Official, vandal@svta.com

DOE Grant No.  DE-FG02-03ER83790

Amount:  $742,674

Substantial improvements in high-power performance are predicted for high-frequency Al(In)GaN-based High Electron Mobility Transistors (HEMTs) on SiC substrates.  This project will utilize modified molecular beam epitaxy (MBE) growth techniques and develop microelectronics processes for the fabrication of high-power (In)AlGaN/(In)GaN HEMTs.  Expected performance parameters include: current density greater than 1.2A/mm, extrinsic transconductance values greater than 400 mS/mm, fT greater than 200 GHz, and power density greater than 8 W/mm at 40 GHz.  Phase I optimized the MBE growth of (In)AlGaN/(In)GaN heterostructures on SiC substrates, developed microelectronic processes for the fabrication of high-power and high-frequency InAlGaN-based HEMTs, and measured the dc and rf performance of InAlGaN-based HEMTs.  Phase II will:  (1) perform device modeling to determine optimal device structures for InAlGaN-based HEMTs; (2) utilize modified MBE growth techniques to grow high quality In-contaning films and structures; (3) optimize device processing and demonstrate substantial improvements in device performance of InAlGaN-based HEMTs; and (4) improve device uniformity and yield on 2-inch and 3-inch SiC wafers. 

Commercial Applications and Other Benefits as described by the awardee:  Improved AlInGaN-based power HEMTs should have numerous civilian and defense applications including radar tracking, cellular base stations, telemetry, and satellite communications.