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Parallel Data Collection Wavelength Dispersive X‑ray Spectrometer for Scanning Electron Microscopy--Parallax Research, Inc., 2818‑H Industrial Plaza Drive, Tallahassee, FL 32301; 850‑580‑5481

Dr. David O’Hara, Principal Investigator, prlax@mindspring.com

Dr. David O’Hara, Business Official, prlax@mindspring.com

DOE Grant No. DE-FG 02‑08ER84995

Amount: $96,988

This project will develop parallel data collection technology for scanning electron microscopes, used for materials science studies at DOE facilities. The new Wavelength Dispersive X-ray Spectrometer (WDS) will simultaneously scan and show the entire spectral interval it covers, rather than the slow serial scan of a conventional WDS. This parallel scanning WDS will closely resemble an Energy Dispersive Spectrometer (EDS) in the appearance of data but will have the energy resolution of WDS. Such a spectrometer will enable very fast decision making by the user, who will not have to wait for an entire serial-type WDS scan.