1. INSTRUMENTATION FOR NEUTRON Scattering, ELECTRON MICROSCOPY, and Scanning Probe Microscopy

The Department of Energy supports research and facilities in neutron scattering and electron and scanning probe microscopy areas for the characterization of materials.

Grant applications are sought only in the following subtopics:

a. Neutron Facilities—As a unique and increasingly utilized research tool, neutrons have made invaluable contributions to the physical, chemical, and biological sciences. The Department is committed to enhancing the operation and instrumentation of its present and future neutron science facilities so that their full potential is realized.

Grant applications are sought to develop improved neutron detectors and associated electronics needed for DOE’s existing and proposed steady-state and pulsed neutron scattering facilities (References 1-3). New detectors must represent substantial improvements in one or more of the following parameters: efficiency at short wavelengths, high counting rate capability, high spatial resolution in one or two dimensions, time resolution (for pulsed source applications), cost per unit area, and adaptability to unique geometries. Detectors for pulsed neutron applications must be able to identify the time of arrival of each neutron. All detectors must have low intrinsic dark count rates and low sensitivity to gamma radiation.

Grant applications are sought to develop novel or improved neutron optical components for use in neutron scattering instruments (References 4-6). Such components include, but are not limited to, neutron choppers, neutron guides, neutron lenses and focusing mirrors, neutron monochromators, neutron polarization devices including ³He polarizing filters, radio-frequency flippers, superconducting coils, and Meissner shields. Grant applications also are sought for novel uses of such components in neutron scattering instruments.

Grant applications also are sought to develop novel or improved sample environments (Reference 7), including extreme temperature, pressure, magnetic field, and chemical environments. Specific areas of interest include robotics for sample exchange and alignment, and equipment automation and data management systems to facilitate high throughput experiments at high flux sources.

Finally, grant applications are sought to develop virtual neutron scattering instruments utilizing a web portal based interface with access to high performance computing ( HPC ), grid, and/or cluster computing resources. Portal applications should enable users to configure virtual instruments to simulate experiment measurements and may include interfaces with materials simulations to provide a broader, more comprehensive range of sample scattering responses.

Questions - contact Lane Wilson (Lane.Wilson@science.doe.gov)

b. Electron Microscopy and Scanning Probe Microscopy (SPM)—The enabling component of nanoscience, recognized in workshop reports sponsored by National Nanotechnology Initiative and by the Department of Energy, is the capability to image, manipulate, and control matter and energy on nanometer, molecular, and ultimately atomic levels. Electron and scanning probe microscopies are vital to the advancement of materials science, nanoscience, and nanotechnology, and are used in numerous research projects and facilities funded by the Department. Innovative instrumentation developments offer the promise of radically improving the capabilities of electron and scanning probe microscopies, thereby stimulating new innovations in materials science. Grant applications are sought to develop:

• Stages, holders, and/or detectors with new capabilities for quantifying data and collection efficiency in electron beam instruments. Areas of interest include: (1) extremely stable holders and stages that allow long exposure/analysis times, with accurate tilting and alignment capability (to an angle accuracy ±0.005 degrees on two axes, while maintaining eucentricity to within 20 nm); (2) fast CCD camera systems that allow electron imaging exposure times in the millisecond range and kHz frame rates; (3) cameras optimized for handling femto-second electron pulses with MHz repetition rate; (4) high sensitivity electron imaging systems based on CCD technology, which provide 24 bit dynamic range or better over large areas; and (5) X-ray detectors employing drift technology base upon material of higher atomic number (i.e. for example Ge rather than Si), to increase the high energy detection capability. Proposed approaches for electron detectors must show suitability for either low- or high-energy electrons, and address one or more of the following three aspects: high quantum efficiency, high spatial resolution, and high temporal resolution. Proposed approaches for x-ray detectors should show significant improvement in sensitivity or spectral resolution for elemental analysis in electron microscopes.

• Stages and holders with new capabilities for in situ experiments or sample manipulation in the electron microscope. Stages and/or holders must provide for one or more of the following: (1) stable (low drift) stages that have electrical connections for up to 5 signals (minimum of two independent signal circuits), can be tilted at least 60 degrees in the electron microscope, and can be operated from 10K- 373K; (2) manipulation or measurement of the sample using a 4-probe nanomanipulator, including the capability to measure deflection or strain, or the capability to apply electric fields or current; and (3) stages that enable different types of in situ science, such as behavior in liquid and/or gaseous environments (30 Torr or higher). Also of interest are: stages that allow precision alignment of samples to an angle accuracy of ±0.005 degrees on two axes; or stages that allow the application of a magnetic field up to 5000 Oe, with a capability to rotate the field orientation in the specimen plane with respect to the sample.

• New electron sources that can operate from pulsed modes to femtosecond frequencies. Of particular interest are laser-assisted field emission guns for application to pulsed mode operation in Transmission Electron Microscopy (TEM) mode.

• Systems for automated data collection, processing, and quantification. Systems should include hardware and platform-independent software for data collection and visualization, including automated measurement and mapping of crystallography, internal magnetic or electric field, or strain, and for multi-spectral analysis. Software and quantification routines for image reconstruction and for interpretation of interference patterns/holography are encouraged.

• New generations of functional SPM probes, sample holders/cells, and controller/software support for ultrafast, environmental and functional detection. Areas of interest include: (1) insulated and shielded probes for high-resolution electrical imaging in conductive solutions; (2) probes integrated with electro-optical switches for ultrafast imaging; and (3) probes integrated with electrical and magnetic field sensors, including field effect transistors, single electron transistors, and Hall probes for probing dynamic electrical and magnetic phenomena in the 10 MHz – 100 GHz regime. Complementary to this effort is the development of reliable hardware, software, and calibration methods for the vertical, lateral, and longitudinal spring constants of the levers, sensitivities, and frequency-dependent transfer functions of the probes.

• A new generation of optical detectors for beam-deflection-based force microscopies. Areas of interest include: (1) low-noise laser sources and detectors approaching the thermomechanical noise limit, (2) high bandwidth optical detectors operating in the 10-100 MHz regime, and (3) small-spot (sub - 3 micron) laser sources for video-rate Atomic Force Microscopy (AFM) measurements.

• Systems for next-generation controllers and stand-alone modules for data acquisition and analysis beyond currently employed homodyne and phase-locked loop detectors. Areas of interest include: (1) multiple-frequency detection schemes for mapping energy dissipation, as well as mechanical and other functional properties, (2) active control of tip trajectory, and (3) single event detection in molecular systems.

Grant applications submitted to this subtopic must address improvements in electron beam and scanning probe instrumentation capabilities beyond the present state of the art.

Questions - contact Jane Zhu (Jane.Zhu@science.doe.gov)

Subtopic a References:

1 Anderson, I. S. and Guerard, B., eds., Advances in Neutron Scattering Instrumentation, San Diego, CA, July 7-8, 2002, Proceedings of the SPIE (International Society for Optical Engineering), Vol. 4785, Bellingham, WA: SPIE, 2002. (ISBN: 0-8194-45525)

2 Cooper, R., et al., eds., “A Program for Neutron Detector Research and Development,” White Paper based on workshop held July 2002. (Full report available at: http://www.sns.gov/pubs/detector_research_white_paper_mar03.pdf)

3 Wilpert, T., ed., “International Workshop on Position-Sensitive Neutron Detectors: Status and Perspectives,” Hahn-Meitner-Institute, Germany, June 28-30, 2001. (Full report is available at: www.hmi.de/bensc/psnd2001. On menu at left, click on “Abstracts and Slide Reports”)

4 Majkrzak C. F. and Wood, J. L., eds., Neutron Optical Devices and Applications, San Diego, CA, July 22-24, 1992, Proceedings of the SPIE, Vol. 1738, Bellingham, WA: SPIE, 1992. (ISBN: 0-8194-09111)

5 Mezei, F., et al., eds., Neutron Spin Echo Spectroscopy, Lecture Notes in Physics, 601, New York, Springer Verlag, 2003. (ISBN: 3-5404-42936).

6 Klose, et al., eds., “Proceedings of the Fifth International Workshop on Polarized Neutrons in Condensed Matter Investigations,” Washington, D.C., June 1-4, 2004, Physica B: Condensed Matter, Vol. 356, Elsevier, 2004. (ISSN: 0921-4526)

7 Crow, J., et al., “SENSE: Sample Environments for Neutron Scattering Experiments,” Tallahassee, FL, September 24-26, 2003, Workshop Report, 2004. (Full report available at: http://neutrons.ornl.gov/workshops/tallahassee_workshops_2003/presentations/Meissner.pdf)

Subtopic b References:

1 “Proceedings of the Microscopy Society of America,” Annual Meetings, Springer-Verlag, New York, Inc. (ISSN: 1431-9276)

2 “Ultramicroscopy,” 78(1-4), Elsevier-Holland, June 1999. (ISSN: 0304-3991)

3 Williams, D. B. and Carter, C. B., Transmission Electron Microscopy: A Textbook for Materials Science, Vols. 1-4, Plenum Publishing Corp., New York-London, 1996. (ISBN: 0-3064-52472)

4 “Aberration Correction in Electron Microscopy: Materials Research in an Aberration-Free Environment,” Argonne National Laboratory, July 18-20, 2000, Workshop Report, U.S. DOE Argonne National Laboratory, October 2001. (Full report available at: http://ncem.lbl.gov/team/TEAM%20Report%202000.pdf)

5 BES-Sponsored workshop reports that address the current status and possible future directions of some important research areas are available on the web. (URL: http://www.science.doe.gov/bes/reports/list.html)

6 “Nanoscience Research for Energy Needs,” Report of the National Nanotechnology Initiative Grand Challenge Workshop, March 16-18, 2004 (https://public.ornl.gov/conf/nanosummit2004/energy_needs.pdf)

7 Morita, S. (Ed.), “Roadmap of Scanning Probe Microscopy,” (Series: NanoScience and Technology) Springer, 2006 (ISBN: 9-7835-40343-141)

8 S. Kalinin and A. Gruverman, “Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale,” Springer, 2006. (ISBN-10: 0-3872-86675) (ISBN-13: 9-7803-87286-679)