5.  INSTRUMENTATION FOR ELECTRON MICROSCOPY and Scanning Probe Microscopy

 

The Department of Energy supports research and facilities in electron and scanning probe microscopy for the characterization of materials.  Innovative instrumentation developments offer the promise of radically improving these capabilities, thereby stimulating new innovations in materials science.  Grant applications must address improvement in electron beam or scanning probe instrumentation capabilities beyond the present state-of-the-art.  Grant applications are sought only in the following subtopics:

 

a. Electron Microscopy and Microcharacterization—The Department of Energy supports electron beam microcharacterization of materials as a core research area.  Electron microscopy and microcharacterization capabilities are important in the materials and biological sciences and are used in numerous research projects funded by the Department.  To support this research, grant applications are sought to develop:

 

·        Stages and holders that provide new capabilities for in situ transmission electron microscopy experiments in liquid and/or gaseous environments.  Approaches of interest should provide a capability to (1) reach 80 Torr or higher during operation, and (2) apply or measure at least two separate signals, such as current and voltage.

 

·        New electron sources that can operate from pulsed modes to femtosecond frequencies.  Of particular interest are laser-assisted field emission guns for application to pulsed mode operation in Transmission Electron Microscopy (TEM) mode.

 

·        Improved electron detectors suitable for 100-400kV electrons.  Grant applications must focus on parallel imaging devices for conventional or scanning transmission electron microscopy.  At least one of the following three aspects must be addressed:  high quantum efficiency, high spatial resolution, and high temporal resolution.  Proposed detectors must be robust and not susceptible to electron beam damage.

 

·        Systems for automated data collection, processing, and quantification.  Approaches of interest should include (1) hardware and platform-independent software for data collection and visualization, (2) automated measurement and mapping of crystallography, internal magnetic or electric field, or strain, and (3) multi-spectral analysis.  Software and quantification routines for image reconstruction and for interpretation of interference patterns/holography are encouraged.

 

b. Scanning Probe Microscopy (SPM)—The enabling feature of nanoscience, as recognized in workshop reports sponsored by National Nanotechnology Initiative and by the Department of Energy, is the capability to image, manipulate, and control matter and energy on nanometer, molecular, and ultimately atomic scales.  Scanning probe microscopy is vital to the advancement of nanoscience and nanotechnology, and is used in numerous materials research projects and facilities funded by the Department.  Grant applications are sought to develop:

 

·        New generations of functional SPM probes, sample holders/cells (including electrochemical and photoelectrochemical cells), and controller/software support for ultrafast, environmental and functional detection.  Areas of interest include:  (1) insulated and shielded probes for high-resolution electrical imaging in conductive solutions; (2) probes integrated with electro-optical switches for ultrafast imaging; and (3) probes integrated with electrical, thermal, and magnetic field sensors – including field effect transistors, single electron transistors, microwave probes, and Hall probes for probing dynamic electrical and magnetic phenomena in the 10 MHz - 100 GHz regime.  Probes and probe/holder assemblies should be compatible with existing commercial hardware platforms, or bundled with adaptation kits.  Complementary to this effort is the development of reliable hardware, software, and calibration methods for the vertical, lateral, and longitudinal spring constants of the levers, sensitivities, and frequency-dependent transfer functions of the probes.

 

·        A new generation of optical and other cantilever detectors for beam-deflection-based force microscopies.  Areas of interest include:  (1) low-noise laser sources and detectors approaching the thermomechanical noise limit, (2) high bandwidth optical detectors operating in the 10-100 MHz regime, and (3) small-spot (sub-3 micron) laser sources for video-rate Atomic Force Microscopy (AFM) measurements.  Piezoresistive detector demonstrating improved signal to noise are also of interest.

 

·        Systems for next-generation controllers and stand-alone modules for data acquisition and analysis.  Areas of interest include:  (1) multiple-frequency and fast detection schemes for mapping energy dissipation, as well as mechanical and other functional properties; (2) active control of tip trajectory, grid, and spectral acquisition; and (3) single event detection in molecular systems.  Proposed systems should include provisions for rapid data collection (beyond the ~1kHz bandwidth of feedback/image acquisition of a standard SPM), processing, and quantification; and hardware and platform-independent software for data collection and visualization, including multispectral and multidimensional image analysis (i.e., for force volume imaging or other spectroscopic imaging techniques generating 3D or 4D data arrays).  For rapid data acquisition systems, software and data processing algorithms for data interpretation are strongly encouraged.

 

·        Environmental SPM systems operating in the 10-8 Torr - 1 atm pressure range, supporting existing topographic, electrical, magnetic, mechanical, piezoelectric, and other imaging modes. 

 

Questions - contact Jane Zhu (Jane.Zhu@science.doe.gov)

 

References:

 

1        “Proceedings of the Microscopy Society of America,” Annual Meetings, Springer-Verlag, New York, Inc.  (ISSN:  1431-9276)

 

2        “Ultramicroscopy,” 78(1-4), Elsevier-Holland, June 1999.  (ISSN:  0304-3991)

 

3        Williams, D. B. and Carter, C. B., Transmission Electron Microscopy:  A Textbook for Materials Science, Vols. 1-4, Plenum Publishing Corp., New York-London, 1996.  (ISBN:  0-3064-52472)

 

4        “Aberration Correction in Electron Microscopy:  Materials Research in an Aberration-Free Environment,” Argonne National Laboratory, July 18-20, 2000, Workshop Report, U.S. DOE Argonne National Laboratory, October 2001.  (Full report available at:  http://ncem.lbl.gov/team/TEAM%20Report%202000.pdf)

 

5        BES-Sponsored workshop reports that address the current status and possible future directions of some important research areas are available on the web. (URL: http://www.science.doe.gov/bes/reports/list.html)

 

6        “Nanoscience Research for Energy Needs,” Report of the National Nanotechnology Initiative Grand Challenge Workshop, March 16-18, 2004 (https://public.ornl.gov/conf/nanosummit2004/energy_needs.pdf)  

 

7        Morita, S. (Ed.), “Roadmap of Scanning Probe Microscopy,” (Series: NanoScience and Technology) Springer, 2006 (ISBN: 9-7835-40343-141)

 

8        S. Kalinin and A. Gruverman, “Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale,” Springer, 2006. (ISBN-10: 0-3872-86675) (ISBN-13: 9-7803-87286-679)

 

9.   M. Li, H.X. Tang, M.L. Roukes, “Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications” Nature 2, 114 (2007).